RCA Electron Microscopy Core
Equipment
- Transmission Electron Microscope, LaB6, JEOL JEM-2100
- Scanning Electron Microscope - JSM-6490LV
- Scanning Electron Microscope - JEOL JSM7600F
- JEOL IB-09010CP Ion Beam Cross Section Polisher
- MicroCT GE X-ray Scanner System
- Cressington 208C Carbon Coating System
- Tensile Stage, Deben MICROTEST 200N
- Cressington 108Auto Sputter Coater
- JSM-IT200LA InTouchScope Scanning Electron Microscope
- TEM Transmission Electron Microscope JEOL JEM-1400 Flash
- Leica EM GP2 Plunge Freezer