GE Inspection Technologies v|tome|x s 240kV microfocus X-ray computed tomography system with additional 180kV HPNF submicron X-ray tube (nanoCT) and high-contrast digital flat panel detector.

• Department: RCA Electron Microscopy Core
• Building:USDA Northern Crop Science Laboratory
• Room:
• Contact Person: Scott Payne
• Availability: Available - Recharge Center