Description: GE Inspection Technologies v|tome|x s 240kV microfocus X-ray computed tomography system with additional 180kV HPNF submicron X-ray tube (nanoCT) and high-contrast digital flat panel detector.

Contact Person: Scott Payne

Department: RCA Electron Microscopy Core

Building: USDA Northern Crop Science Laboratory

Room:

Availability: Available - Recharge Center