Scanning Electron Microscope - JSM-6490LV
Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098). Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis. Remotely operable for K-12 students.
- Department: RCA Electron Microscopy Core
- Building:USDA Northern Crop Science Laboratory
- Room:
- Contact Person: Scott Payne
- Availability: Available - Recharge Center