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Scanning Electron Microscope - JSM-6490LV

Image of Scanning Electron Microscope - JSM-6490LV

Description: Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098).  Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis.  Remotely operable for K-12 students.

Contact Person: Scott Payne

Department: RCA Electron Microscopy Core

Building: USDA Northern Crop Science Laboratory

Room:

Availability: Available - Recharge Center