Scanning Electron Microscope - JSM-6490LV
Description: Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098). Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis. Remotely operable for K-12 students.
Contact Person: Scott Payne
Department: RCA Electron Microscopy Core
Building: USDA Northern Crop Science Laboratory
Room:
Availability: Available - Recharge Center