High-resolution 200-kV LaB6 analytical transmission electron microscope system (NSF MRI #0821655).  Energy dispersive X-ray spec­trometry (EDS), scanning transmission electron microscopy (STEM), and parallel electron energy-loss spectrometry (EELS) for micro­analysis.  Mag­ni­fications of 2,000 to 1,500,000 times; optimal resolution 0.23 nm.  Gatan dimple grinder and Gatan Precision Ion Polishing System (PIPS) for sample preparation.

• Department: RCA Electron Microscopy Core
• Building:USDA Northern Crop Science Laboratory
• Room:
• Contact Person: Scott Payne
• Availability: Available - Recharge Center