Tensile Stage, Deben MICROTEST 200N
Description: Designed for use with the JEOL JSM-6490LV scanning electron microscope, where it permits live SEM observation/recording of visible changes in tested materials through failure. Also can be used with the optical microscope or as a data-logging test module, with no image display.
Contact Person: Scott Payne
Department: RCA Electron Microscopy Core
Building: USDA Northern Crop Science Laboratory
Room:
Availability: Available - Recharge Center