Designed for use with the JEOL JSM-6490LV scanning electron microscope, where it permits live SEM observation/recording of visible changes in tested materials through failure.  Also can be used with the optical microscope or as a data-logging test module, with no image display.

• Department: RCA Electron Microscopy Core
• Building:USDA Northern Crop Science Laboratory
• Room:
• Contact Person: Scott Payne
• Availability: Available - Recharge Center