Description: JEOL JSM-7600F high-resolution analytical scanning electron microscope Schottky in-lens field-emission gun Magnification range 25-1 million X Resolution 1 nm at 15 kV, 1.5 nm at 1 kV, 0.8 nm at 30 kV for STEM Thermo energy-dispersive X-ray analysis (silicon drift detector) Detectors: in-lens secondary, in-lens backscatter, low-angle backscatter, in-chamber secondary, STEM Selectable bias to specimen stage for beam deceleration and surface-data enhancement Hysitron PI-85 nanoindenter JEOL IB-09010CP cross-sectional polisher Cressington 208C high-resolution carbon coater

Contact Person: Scott Payne

Department: RCA Electron Microscopy Core

Building: USDA Northern Crop Science Laboratory

Room:

Availability: Available - Recharge Center