Research 2: 116
Equipment
AFM SYSTEM AND COMPONENTSSCANNING ELECTRON MICROSCOPE- KLA P15 SURFACE PROFILER
- MTS Electromechanical Testing 5kN
NXR 9650 EDGE SPECTROMETERKODAK INVIVO FX SYSTEM- Hysitron Nanoindenter Nanomechanical Test Apparatus
- FTIR Spectrometer System - Bruker Vertex 70
StepOnePlus Real-Time PCRInstron 5942 Mechanical TesterMP W3601 Digital Imaging SystemMaxwell 16 Research InstrumentEpoch Biotech Microplate ReaderTissuewave TS Wave 2HM355S MicrotomeAllegra X-14/r CentrifugeMaxQ 4000 Benchtop Shaking IncubatorE-15 Plant Growth Chamber- Optical Profiler Veeco Wyko NT3300
- P-15 Longscan Contact/Stylus Profiler
- Scanning Acoustic Microscope (CSAM)
- Scanning Electron Microscope (SEM)
- Chemat Tech Spin-Coater KW-4A
- Delta Design Thermal Chamber (Blue)