Description:

Non-Contact Optical Profiler that can perform 3D surface topography measurements. Measures heights from Angstroms to millimeters, with vertical resolution down to 0.1 nm. The NT3300 is ideally suited for quality inspection, failure analysis, and rapid production measurement of MEMS, semiconductor packaging, medical devices, automotive systems and many other applications.

Contact Person: Fred Haring

Department: RCA Research Operations Core

Building: Research 2

Room: 116

Availability: Available - Recharge Center