Description:

Supports wide range of device characterization capabilities, uncompromised measurement reliability, and efficient and repeatable measurement. It supports all state-of-the-art measurements (IV, CV, and fast pulsed IV), giving it the ability to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.

Contact Person: Fred Haring

Department: RCA Research Operations Core

Building: Research 2

Room: 112

Availability: Available - Recharge Center