Supports wide range of device characterization capabilities, uncompromised measurement reliability, and efficient and repeatable measurement. It supports all state-of-the-art measurements (IV, CV, and fast pulsed IV), giving it the ability to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.

• Department: RCA Research Operations Core
• Building:Research 2
• Room:112
• Contact Person: Fred Haring
• Availability: Contact for Availability